Reading, Michael; Price, Duncan M.; Lever, Trevor, J; Generalized and Localized Heating in micro-Thermal Analysis Proc. 27th North American Thermal Analysis Society Conference, September 20-22 (1999) Savannah, Georgia, USA, p. 690; Proc. 28th North American Thermal Analysis Society Conference, October 4-6 (2000), Orlando, Florida, USA, p. 38

In a typical Micro-Thermal Analysis experiment, the thermal probe is used to heat a localized area of the sample. Images of the surface of the sample are obtained based upon the sample's thermal properties. If the probe is held at a single location and the temperature is scanned, localized thermal properties (such as Micro-TMA and Micro-MDTA) may be measured. The use of a sample temperature stage allows the entire sample to be heated or cooled in a Micro-TA system. For imaging, the effect of sample temperature on the sample structure and morphology can be investigated. In this mode, it is not necessary to use a thermal probe and very high-resolution images can be obtained using standard AFM contact or non-contact probes with the sample held at a temperature above and below a transition temperature. For localized thermal analysis measurements, sub-ambient transition temperatures can be measured.